Description
The LAM 685-069171-100 is a versatile instrument that can be used for a variety of applications, including:
- Measuring the thickness and composition of thin films
- Analyzing the chemical composition of bulk materials
- Identifying contaminants in materials
- Monitoring the quality of semiconductor wafers
- Studying the properties of new materials
Here are some of the specifications of the LAM 685-069171-100:
- Resolution: 0.005 cm-1
- Wavenumber range: 4000 to 400 cm-1
- Sample compartment: Vacuum or purge
- Software: SpectraSuite
We are a reliable supplier that can provide you with PLC, DCS, and ESD products. We provide thoughtful service to help you expand into the automation market.
We are a professional, reliable, and cost-effective choice that can provide new automation and control components for all major brands. We have a large number of major brands, including:
ABB, GE, Allen Bradley, Honeywell, Emerson, Bently Nevada, Prosoft, Westinghouse, Triconex, Foxboro, ICS Triplex, Hima, Schneider Bachmann, Yokogawa, Woodward, Woodhead, KEBA, ect
If you need it, we can solve your missing parts or exchange them. Welcome to inquire by phone! We will provide you with the highest quality service!
Reviews
There are no reviews yet.