Description
The National Instruments PXIe-4135 is a high-precision, system source measure unit (SMU) designed for a variety of applications, including:
- Manufacturing test: Performing electrical characterization and validation of electronic components during production.
- Board-level test: Testing individual circuit boards for functionality and troubleshooting issues.
- Lab characterization: Analyzing the electrical properties of devices such as integrated circuits (ICs), power management ICs (PMICs), radio frequency ICs (RFICs), discrete components like LEDs and optical transceivers.
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