Description
The National Instruments PXIe-4137 is a high-performance source measure unit (SMU) designed for a variety of applications, including:
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- Semiconductor characterization
- Battery testing
- Solar cell testing
- LED testing
- General purpose I-V testing
The PXIe-4137 offers a wide range of features, including:
- DC voltage source and sink: Up to 20 V at 10 A, 40 V at 5 A, or 100 V at 2 A
- DC current source and sink: Up to 10 A at 20 V, 5 A at 40 V, or 2 A at 100 V
- Pulse source and sink: Up to 20 V at 10 A, 40 V at 5 A, or 100 V at 2 A with pulse widths down to 10 ns
- High-resolution A/D converter: 16 bits, 1 MS/s
- Low-noise D/A converter: 12 bits, 1 MS/s
- Four-wire sense: Enables accurate measurement of voltage and current at the device under test
- Built-in overvoltage and overcurrent protection
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