Description
The National Instruments PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. It is designed for a wide range of applications, including semiconductor characterization, device testing, and circuit debugging.
The PXIe-4162 has a number of features that make it ideal for these applications, including:
- High precision: The PXIe-4162 can source and measure voltage and current with high accuracy, making it suitable for even the most delicate measurements.
- High density: The PXIe-4162 has 12 SMU channels, which allows you to test multiple devices or circuits simultaneously.
- Wide range: The PXIe-4162 can source and measure voltage from -24 V to +24 V and current from 1 uA to 100 mA.
- Fast sweep speed: The PXIe-4162 can sweep voltage and current at up to 100 kHz, which allows you to quickly characterize devices and circuits.
- SourceAdapt technology: SourceAdapt technology allows you to tune the transient response of the PXIe-4162 to match the characteristics of any load. This ensures that you get accurate measurements even when testing devices with complex impedances.
Here are some additional details about the PXIe-4162:
- Physical dimensions: 2.0 cm x 13.0 cm x 21.6 cm (0.8 in. x 5.1 in. x 8.5 in.)
- Weight: 1.2 kg (2.6 lb)
- Power consumption: 58 W
- Operating temperature: 0°C to 55°C (32°F to 131°F)
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